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12th Asian Test Symposium (ATS'03)
Build-In-Self-Test for Software
Xi?an, China
November 16-November 19
ISBN: 0-7695-1951-2
ASCII Text
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Shiyi Xu, "Build-In-Self-Test for Software," Asian Test Symposium, pp. 220, 12th Asian Test Symposium (ATS'03), 2003.
 
 
BibTex
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@article{ 10.1109/ATS.2003.1250813,
author = {Shiyi Xu},
title = {Build-In-Self-Test for Software},
journal ={Asian Test Symposium},
volume = {0},
year = {2003},
issn = {1081-7735},
pages = {220},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250813},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Build-In-Self-Test for Software
SN - 1081-7735
SP
EP
A1 - Shiyi Xu,
PY - 2003
KW - Build-In-Self-Test (BIST)
KW - Design for Testability
KW - Software Testing
VL - 0
JA - Asian Test Symposium
ER -
 
Shiyi Xu, Shanghai University
Software testing has been a hard nut in the testing areas for its complex and time-consuming. Taking advantage of mature technologies in hardware testing, we proposed a new approach to developing a new approach to developing a new dimension of software testing called Build-in-self-test (BIST) for software, which has long been applied in hardware testing as well as design for testability. This idea of testing mehtods from hardware is just to alleviate the burden of testing for software by transferring some testing work into programmer during programming so that the programmer and the tester can work together. Some new idea is presented for further working on it.
Index Terms:
Build-In-Self-Test (BIST), Design for Testability, Software Testing
Citation:
Shiyi Xu, "Build-In-Self-Test for Software," ats, pp.220, 12th Asian Test Symposium (ATS'03), 2003
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