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12th Asian Test Symposium (ATS'03)
Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains
Xi?an, China
November 16-November 19
ISBN: 0-7695-1951-2
ASCII Text
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Matthias Beyer, Winfried Dulz, Fenhua Zhen, "Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains," Asian Test Symposium, pp. 102, 12th Asian Test Symposium (ATS'03), 2003.
 
 
BibTex
x
 
@article{ 10.1109/ATS.2003.1250791,
author = {Matthias Beyer and Winfried Dulz and Fenhua Zhen},
title = {Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains},
journal ={Asian Test Symposium},
volume = {0},
year = {2003},
issn = {1081-7735},
pages = {102},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250791},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains
SN - 1081-7735
SP
EP
A1 - Matthias Beyer,
A1 - Winfried Dulz,
A1 - Fenhua Zhen,
PY - 2003
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
Matthias Beyer, University of Erlangen-Nuremberg
Winfried Dulz, University of Erlangen-Nuremberg
Fenhua Zhen, University of Erlangen-Nuremberg

The objective of this paper is to automatically generate a MCUM (Markov Chain Usage Model) starting from OMG UML-SD (Sequence Diagram) in order to derive TTCN-3 (Testing and Test Control Notation version 3) compatible test case definitions.

Our approach is a combination of statistical usage testing and specification-based testing. Within this paper, special attention is given to international standardized FDT notations, specifically UML-SD and MSC. We have also defined an XML-based representation format called MCML (Markov Chain Markup Language) to build a common interface between various parts of the MaTeLo tool set. In the case of UML-SD we use XMI descriptions in order to generate the desired MCML format.

Citation:
Matthias Beyer, Winfried Dulz, Fenhua Zhen, "Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains," ats, pp.102, 12th Asian Test Symposium (ATS'03), 2003
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