12th Asian Test Symposium (ATS'03)
Non-Linear Celluar Automata Based PRPG Design (Without Prohibited Pattern Set) In Linear Time Complexity
Xi?an, China
November 16-November 19
ISBN: 0-7695-1951-2
This paper reports an efficient BIST solution for VLSI circuits. The solution is based on an on-chip Pseudo-Random Pattern Generator (PRPG). The test solution guarantees non-issuence of the test patterns declared prohibited to a CUT (Circuit Under Test). It has been developed around non-linear Celluar Automata (CA) and provides a linear time solution of designing an n-bit PRPG. Experimental results confirm the enhanced pseudo-random quality of the test patterns due to application of non-linear CA rules.
Citation:
Sukanta Das, Anirban Kundu, Subhayan Sen, Biplab K. Sikdar, P. Pal Chaudhuri, "Non-Linear Celluar Automata Based PRPG Design (Without Prohibited Pattern Set) In Linear Time Complexity," ats, pp.78, 12th Asian Test Symposium (ATS'03), 2003