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12th Asian Test Symposium (ATS'03)
Non-Linear Celluar Automata Based PRPG Design (Without Prohibited Pattern Set) In Linear Time Complexity
Xi?an, China
November 16-November 19
ISBN: 0-7695-1951-2
Sukanta Das, Bengal Engineering College
Anirban Kundu, Bengal Engineering College
Subhayan Sen, Bengal Engineering College
Biplab K. Sikdar, Bengal Engineering College
P. Pal Chaudhuri, Bengal Engineering College
This paper reports an efficient BIST solution for VLSI circuits. The solution is based on an on-chip Pseudo-Random Pattern Generator (PRPG). The test solution guarantees non-issuence of the test patterns declared prohibited to a CUT (Circuit Under Test). It has been developed around non-linear Celluar Automata (CA) and provides a linear time solution of designing an n-bit PRPG. Experimental results confirm the enhanced pseudo-random quality of the test patterns due to application of non-linear CA rules.
Citation:
Sukanta Das, Anirban Kundu, Subhayan Sen, Biplab K. Sikdar, P. Pal Chaudhuri, "Non-Linear Celluar Automata Based PRPG Design (Without Prohibited Pattern Set) In Linear Time Complexity," ats, pp.78, 12th Asian Test Symposium (ATS'03), 2003
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