CMOS Floating Gate Defect Detection Using I <sub>DDQ</sub> Test with DC Power Supply

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11th Asian Test Symposium (ATS'02)

CMOS Floating Gate Defect Detection Using I _DDQ Test with DC Power Supply

Guam, USA

November 18-November 20

ISBN: 0-7695-1825-7

	ASCII Text	x
	Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo, "CMOS Floating Gate Defect Detection Using I <sub>DDQ</sub> Test with DC Power Supply," Asian Test Symposium, pp. 417, 11th Asian Test Symposium (ATS'02), 2002.

	BibTex	x
	@article{ 10.1109/ATS.2002.1181747, author = {Hiroyuki Michinishi and Tokumi Yokohira and Takuji Okamoto and Toshifumi Kobayashi and Tsutomu Hondo}, title = {CMOS Floating Gate Defect Detection Using I <sub>DDQ</sub> Test with DC Power Supply}, journal ={Asian Test Symposium}, volume = {0}, year = {2002}, issn = {1081-7735}, pages = {417}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181747}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - CMOS Floating Gate Defect Detection Using I <sub>DDQ</sub> Test with DC Power Supply SN - 1081-7735 SP EP A1 - Hiroyuki Michinishi, A1 - Tokumi Yokohira, A1 - Takuji Okamoto, A1 - Toshifumi Kobayashi, A1 - Tsutomu Hondo, PY - 2002 KW - null VL - 0 JA - Asian Test Symposium ER -

Hiroyuki Michinishi, Okayama University of Science

Tokumi Yokohira, Okayama University

Takuji Okamoto, Okayama University of Science

Toshifumi Kobayashi, Mitsubishi Electric Co.

Tsutomu Hondo, Sharp Takaya Electronics Industry Co.,Ltd.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181747

In this paper, we propose a new I_DDQ test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by nei-ther any functional logic test nor any conventional I_DDQ test.

Citation:

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo, "CMOS Floating Gate Defect Detection Using I _DDQ Test with DC Power Supply," ats, pp.417, 11th Asian Test Symposium (ATS'02), 2002

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