We propose an efficient test scheduling and test access architecture for system-on-chip. The test time and test control complexity are optimized under the test power and TAM resource constraints. Using our heuristic algorithms, the test scheduling can be done rapidly with small test time penalty when compared with previous works. Under an existing SOC test framework, the test access hardware can be generated from the scheduling result. Experimental results show that the proposed scheduling is hardware efficient. The system integrator can evaluate the test access architecture and perform test scheduling systematically.