In this paper, we present a technique for reducing test length of counter-based pseudo-exhaustive built-self-testing (BIST) using width compression method divide-and-conquer strategy. More formally, the faults are divided into K groups such that a binary counter can generate a test set for each group. selecting the size of the binary counter, this technique allows a trade-off between test application time and overhead. The experimental results for the ISCAS?85 ISCAS?89 benchmark circuits demonstrate the efficiency of the proposed technique. In all cases, this low-overhead BIST technique achieves complete fault coverage of stuck-at faults in reasonable test application time.