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11th Asian Test Symposium (ATS'02)
Enhanced Crosstalk Fault Model and Methodology to Generate Tests for Arbitrary Inter-core Interconnect Topology
Guam, USA
November 18-November 20
ISBN: 0-7695-1825-7
Wichian Sirisaengtaksin, University of Southern California
Sandeep K. Gupta, University of Southern California
In this paper we develop a new fault model for capacitive crosstalk in inter-core interconnects. We also develop a framework to generate compact tests for interconnects with arbitrary topologies. Experimental results show that the proposed approach can significantly reduce test application time for large interconnects. We are in the process of extending the framework to interconnects that include tri-state as well as bi-directional nets.
Citation:
Wichian Sirisaengtaksin, Sandeep K. Gupta, "Enhanced Crosstalk Fault Model and Methodology to Generate Tests for Arbitrary Inter-core Interconnect Topology," ats, pp.163, 11th Asian Test Symposium (ATS'02), 2002
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