A two stage non-scan design for testability method proposed. The first stage selects test points based on an earlier testability measure con ict. A new testa- bility measure conflict+ based on conflict analysis of hard-faults in the process of test generation is intro- duced, which emulates most general features of se- quential A TPG. A new design for testability algorithm proposed to select test points by using conflict+. Test points are selected in the second stage based on the hard faults after the initial A TPGrun of the de- sign for testability circuit in the preliminary stage. Ef- fective approximate schemes are adopted to get rea- sonable estimation of the testability measure. Several effective techniques are adopted to accelerate the pro- cess of the proposed design for testability algorithm.