11th Asian Test Symposium (ATS'02) On-chip Analog Response Extraction with 1-Bit &Egr; - Δ Modulators Guam, USA November 18-November 20 ISBN: 0-7695-1825-7
Because of their relative robustness to process variation, &Egr;-Δ modulation techniques are particularly suitable for VLSI implementations. In this paper, we propose to employ the 1-bit &Egr;-Δ modulation ADC (analog-to-digital converter) as the on-chip analog response extractor for analog/mixed-signal BIST (Built-In Self-Test) applications. To validate the idea, a prototype chip with the proposed BIST circuitry has been designed and fabricated. Performances of the BIST circuitry are validated (up to 87 dB dynamic range), and measurement results of the circuit under test (CUT), a 2nd-order low-pass filter, are presented.
Citation:
Hao-Chiao Hong, Jiun-Lang Huang, Kwang-Ting Cheng, Cheng-Wen Wu, "On-chip Analog Response Extraction with 1-Bit &Egr; - Δ Modulators," ats, pp.49, 11th Asian Test Symposium (ATS'02), 2002 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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