Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices

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11th Asian Test Symposium (ATS'02)

Guam, USA

November 18-November 20

ISBN: 0-7695-1825-7

	ASCII Text	x
	Masahiro Ishida, Takahiro J. Yamaguchi, Mana Sona, Hirobumi Musha, "Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices," Asian Test Symposium, pp. 45, 11th Asian Test Symposium (ATS'02), 2002.

	BibTex	x
	@article{ 10.1109/ATS.2002.1181683, author = {Masahiro Ishida and Takahiro J. Yamaguchi and Mana Sona and Hirobumi Musha}, title = {Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices}, journal ={Asian Test Symposium}, volume = {0}, year = {2002}, issn = {1081-7735}, pages = {45}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181683}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices SN - 1081-7735 SP EP A1 - Masahiro Ishida, A1 - Takahiro J. Yamaguchi, A1 - Mana Sona, A1 - Hirobumi Musha, PY - 2002 KW - null VL - 0 JA - Asian Test Symposium ER -

Masahiro Ishida, Advantest Laboratories, Ltd.

Takahiro J. Yamaguchi, Advantest Laboratories, Ltd.

Mana Sona, University of Washington

Hirobumi Musha, Advantest Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181683

This paper presents an experimental study of random jitter modulation in a commercial serializer-deserializer device to demonstrate the effects of possible amplitude modulation in jitter tolerance measurements. The paper recommends alternative methods for injecting random jitter to avoid this source of measurement error.

Citation:

Masahiro Ishida, Takahiro J. Yamaguchi, Mana Sona, Hirobumi Musha, "Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices," ats, pp.45, 11th Asian Test Symposium (ATS'02), 2002

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