Test Limitations of Parametric Faults in Analog Circuits
Guam, USA
November 18-November 20
ISBN: 0-7695-1825-7
ASCII Text
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Jacob Savir, Zhen Guo,
"Test Limitations of Parametric Faults in Analog Circuits,"
Asian Test Symposium, pp. 39, 11th Asian Test Symposium (ATS'02), 2002.
BibTex
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@article{
10.1109/ATS.2002.1181682, author = {Jacob Savir and Zhen Guo}, title = {Test Limitations of Parametric Faults in Analog Circuits}, journal ={Asian Test Symposium}, volume = {0}, year = {2002}, issn = {1081-7735}, pages = {39}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181682}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Asian Test Symposium TI - Test Limitations of Parametric Faults in Analog Circuits SN - 1081-7735 SP EP A1 - Jacob Savir, A1 - Zhen Guo, PY - 2002 KW - null VL - 0 JA - Asian Test Symposium ER -
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.
Citation:
Jacob Savir, Zhen Guo, "Test Limitations of Parametric Faults in Analog Circuits," ats, pp.39, 11th Asian Test Symposium (ATS'02), 2002
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