loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
11th Asian Test Symposium (ATS'02)
A Totally Self-Checking Dynamic Asynchronous Datapath
Guam, USA
November 18-November 20
ISBN: 0-7695-1825-7
ASCII Text
x 
 
Jing-ling Yang, Chiu-sing Choy, Cheong-fat Chan, Kong-pong Pun, "A Totally Self-Checking Dynamic Asynchronous Datapath," Asian Test Symposium, pp. 27, 11th Asian Test Symposium (ATS'02), 2002.
 
 
BibTex
x
 
@article{ 10.1109/ATS.2002.1181680,
author = {Jing-ling Yang and Chiu-sing Choy and Cheong-fat Chan and Kong-pong Pun},
title = {A Totally Self-Checking Dynamic Asynchronous Datapath},
journal ={Asian Test Symposium},
volume = {0},
year = {2002},
issn = {1081-7735},
pages = {27},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181680},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - A Totally Self-Checking Dynamic Asynchronous Datapath
SN - 1081-7735
SP
EP
A1 - Jing-ling Yang,
A1 - Chiu-sing Choy,
A1 - Cheong-fat Chan,
A1 - Kong-pong Pun,
PY - 2002
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
Jing-ling Yang, The University of Hong Kong
Chiu-sing Choy, The Chinese University of Hong Kong
Cheong-fat Chan, The Chinese University of Hong Kong
Kong-pong Pun, The Chinese University of Hong Kong
This paper investigates the inherent totally self-checking (TSC) property of one type of dynamic asynchronous datapath based on Differential Cascode Voltage Logic (DCVSL). As a result, a totally self-checking dynamic asynchronous datapath architecture is proposed. It is simpler than other similar approaches and represents a new approach to fault tolerant design.
Keywords: Totally self-checking asynchronous datapath, differential cascade voltage switch logic, divider.
Citation:
Jing-ling Yang, Chiu-sing Choy, Cheong-fat Chan, Kong-pong Pun, "A Totally Self-Checking Dynamic Asynchronous Datapath," ats, pp.27, 11th Asian Test Symposium (ATS'02), 2002
Usage of this product signifies your acceptance of the Terms of Use.