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11th Asian Test Symposium (ATS'02)
Exact Computation of Maximally Dominating Faults and Its Application to n-Detection Tests
Guam, USA
November 18-November 20
ISBN: 0-7695-1825-7
Ilia Polian, Albert-Ludwigs University
Irith Pomeranz, Purdue University
Bernd Becker, Albert-Ludwigs University
n-detection test sets for stuck-at faults have been shown to be useful in detecting unmodeled defects. It was also shown that a set of faults, called maximally dominating faults, can play an important role in controlling the increase in the size of an n-detection test set as n is increased. In an earlier work, a superset of the maximally dominating fault set was used. In this work, we propose a method to determine exact sets of maximally dominating faults. We also define a new type of n-detection test sets based on the exact set of maximally dominating faults. We present experimental results to demonstrate the usefulness of this exact set in producing high-quality n-detection test sets.
Keywords: Fault dominance, n-detection, formal techniques, BDDs
Citation:
Ilia Polian, Irith Pomeranz, Bernd Becker, "Exact Computation of Maximally Dominating Faults and Its Application to n-Detection Tests," ats, pp.9, 11th Asian Test Symposium (ATS'02), 2002
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