11th Asian Test Symposium (ATS'02) On Generating High Quality Tests for Transition Faults Guam, USA November 18-November 20 ISBN: 0-7695-1825-7
In this work we propose a path-oriented test generation procedure called POTENT to generate high quality tests for transition faults. Both weak non-robust and strong non-robust tests can be generated by POTENT. We classify transition fault tests into six types according to their activation and propagation methods. The basic idea of POTENT is to test a transition fault along a longest testable path passing through the fault site. For transition faults that are activated or propagated through multi-paths, heuristics are proposed to maximize the propagation delay of the target fault. We also propose an efficient method to evaluate the quality of a given transition fault test set. Experimental results show that POTENT generates higher quality transition fault test sets than the conventional test generation method.
Citation:
Yun Shao, Irith Pomeranz, Sudhakar M. Reddy, "On Generating High Quality Tests for Transition Faults," ats, pp.1, 11th Asian Test Symposium (ATS'02), 2002 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||