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11th Asian Test Symposium (ATS'02)
On Generating High Quality Tests for Transition Faults
Guam, USA
November 18-November 20
ISBN: 0-7695-1825-7
Yun Shao, University of Iowa
Irith Pomeranz, Purdue University
Sudhakar M. Reddy, University of Iowa
In this work we propose a path-oriented test generation procedure called POTENT to generate high quality tests for transition faults. Both weak non-robust and strong non-robust tests can be generated by POTENT. We classify transition fault tests into six types according to their activation and propagation methods. The basic idea of POTENT is to test a transition fault along a longest testable path passing through the fault site. For transition faults that are activated or propagated through multi-paths, heuristics are proposed to maximize the propagation delay of the target fault. We also propose an efficient method to evaluate the quality of a given transition fault test set. Experimental results show that POTENT generates higher quality transition fault test sets than the conventional test generation method.
Citation:
Yun Shao, Irith Pomeranz, Sudhakar M. Reddy, "On Generating High Quality Tests for Transition Faults," ats, pp.1, 11th Asian Test Symposium (ATS'02), 2002
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