A new microcode-based BIST (Built-In Self Test) circuitry for embedded memory components is proposed in this paper. The memory BIST implements march algorithms which are slightly modified by adopting DOF (Degree of Freedom) concept to detect ADOFs (Address Decoder Open Faults) on top of conventional stuck faults. Furthermore it is shown that the march BIST modified can capture few NPSFs (Neighborhood Pattern Sensitive Faults) coupled with the Cellular Automata address generator and patterns. The microcode-based memory BIST proposed lends itself to performing different combinations of march and retention tests with less microcode storage than the other approaches.