SmartBIST is a name for a family of streaming scan test pattern decoders that are suitable for on-chip integration. The Automatic Test Pattern Generation (ATPG) algorithms are modified to generate scan test stimulus vectors in a highly compacted source format that is compatible with the SmartBIST decoder hardware. The compacted stimulus vectors are streamed from Automatic Test Equipment (ATE) to the decoder which expands the data stream in real-time into fully expanded scan test vectors. SmartBIST encoding and decoding use simple algebraic techniques similar to those used for LFSR-Coding (also known as LFSR-Reseeding). The specific SmartBIST implementation shown in this paper guarantees that all test cubes can be successfully encoded by the modified ATPG algorithm irrespective of the number and position of the care bits.