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10th Asian Test Symposium (ATS'01)
Benefits of Phase Interference Detection to IC Waveform Probing
Kyoto, Japan
November 19-November 21
ISBN: 0-7695-1378-6
ASCII Text
x 
 
Jeffrey A. Block, William K. Lo, Chris Shaw, "Benefits of Phase Interference Detection to IC Waveform Probing," Asian Test Symposium, pp. 185, 10th Asian Test Symposium (ATS'01), 2001.
 
 
BibTex
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@article{ 10.1109/ATS.2001.990279,
author = {Jeffrey A. Block and William K. Lo and Chris Shaw},
title = {Benefits of Phase Interference Detection to IC Waveform Probing},
journal ={Asian Test Symposium},
volume = {0},
year = {2001},
isbn = {0-7695-1378-6},
pages = {185},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990279},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Benefits of Phase Interference Detection to IC Waveform Probing
SN - 0-7695-1378-6
SP
EP
A1 - Jeffrey A. Block,
A1 - William K. Lo,
A1 - Chris Shaw,
PY - 2001
VL - 0
JA - Asian Test Symposium
ER -
 
Jeffrey A. Block, Schlumberger SABER
William K. Lo, Schlumberger Probe Systems
Chris Shaw, Schlumberger Probe Systems
At-speed, internal-node, backside laser-probing of flip-chip ICs using amplitude and phase-sensitive detection modes is characterized. Results show that phase-sensitive detection gives consistently higher signal quality, is less sensitive to probing conditions such as probe placement and sample drift, and can acquire waveforms at nodes difficult to probe using amplitude detection.
Citation:
Jeffrey A. Block, William K. Lo, Chris Shaw, "Benefits of Phase Interference Detection to IC Waveform Probing," ats, pp.185, 10th Asian Test Symposium (ATS'01), 2001
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