loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
10th Asian Test Symposium (ATS'01)
An Approach to Improve the Resolution of Defect-Based Diagnosis
Kyoto, Japan
November 19-November 21
ISBN: 0-7695-1378-6
ASCII Text
x 
 
Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, Yasuo Sato, "An Approach to Improve the Resolution of Defect-Based Diagnosis," Asian Test Symposium, pp. 123, 10th Asian Test Symposium (ATS'01), 2001.
 
 
BibTex
x
 
@article{ 10.1109/ATS.2001.990270,
author = {Iwao Yamazaki and Hiroki Yamanaka and Toshio Ikeda and Masahiro Takakura and Yasuo Sato},
title = {An Approach to Improve the Resolution of Defect-Based Diagnosis},
journal ={Asian Test Symposium},
volume = {0},
year = {2001},
isbn = {0-7695-1378-6},
pages = {123},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990270},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - An Approach to Improve the Resolution of Defect-Based Diagnosis
SN - 0-7695-1378-6
SP
EP
A1 - Iwao Yamazaki,
A1 - Hiroki Yamanaka,
A1 - Toshio Ikeda,
A1 - Masahiro Takakura,
A1 - Yasuo Sato,
PY - 2001
VL - 0
JA - Asian Test Symposium
ER -
 
Iwao Yamazaki, Hitachi, Ltd.
Hiroki Yamanaka, Hitachi, Ltd.
Toshio Ikeda, Hitachi, Ltd.
Masahiro Takakura, Hitachi Engineering Co., Ltd.
Yasuo Sato, Hitachi, Ltd.
This paper presents a practical approach to improve the resolution of defect-based diagnosis. To diagnose the faulty chips, various techniques are needed as well as modeling the defects precisely. In this paper, some techniques using the layout information, a multi-test diagnosis method, and a testing method for the delay fault will be discussed, and some experimental results of actual chips will be shown. The resolution of the diagnosing test patterns will also be discussed.
Citation:
Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, Yasuo Sato, "An Approach to Improve the Resolution of Defect-Based Diagnosis," ats, pp.123, 10th Asian Test Symposium (ATS'01), 2001
Usage of this product signifies your acceptance of the Terms of Use.