CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application

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10th Asian Test Symposium (ATS'01)

Kyoto, Japan

November 19-November 21

ISBN: 0-7695-1378-6

	ASCII Text	x
	Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada, "CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application," Asian Test Symposium, pp. 117, 10th Asian Test Symposium (ATS'01), 2001.

	BibTex	x
	@article{ 10.1109/ATS.2001.990269, author = {Masaki Hashizume and Masahiro Ichimiya and Hiroyuki Yotsuyanagi and Takeomi Tamesada}, title = {CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application}, journal ={Asian Test Symposium}, volume = {0}, year = {2001}, isbn = {0-7695-1378-6}, pages = {117}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990269}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application SN - 0-7695-1378-6 SP EP A1 - Masaki Hashizume, A1 - Masahiro Ichimiya, A1 - Hiroyuki Yotsuyanagi, A1 - Takeomi Tamesada, PY - 2001 VL - 0 JA - Asian Test Symposium ER -

Masaki Hashizume, University of Tokushima

Masahiro Ichimiya, University of Tokushima

Hiroyuki Yotsuyanagi, University of Tokushima

Takeomi Tamesada, University of Tokushima

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990269

In this paper, a new test method is proposed for detecting open defects in CMOS ICs. The method is based on supply current of ICs generated by applying time-variable supply voltage and electric field from the outside of the ICs. The feasibility of the test is examined by some experiments. The empirical results promise us that by using the method, open defects in CMOS ICs can be detected. Also, the test input vectors for the test method are proposed and it is shown that they can be generated more easily than functional test methods based on stuck-at fault models.

Citation:

Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada, "CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application," ats, pp.117, 10th Asian Test Symposium (ATS'01), 2001

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