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10th Asian Test Symposium (ATS'01)
Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA
Kyoto, Japan
November 19-November 21
ISBN: 0-7695-1378-6
ASCII Text
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M. Gössel, V. Ocheretnij, S. Chakrabarty, "Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA," Asian Test Symposium, pp. 57, 10th Asian Test Symposium (ATS'01), 2001.
 
 
BibTex
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@article{ 10.1109/ATS.2001.990259,
author = {M. Gössel and V. Ocheretnij and S. Chakrabarty},
title = {Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA},
journal ={Asian Test Symposium},
volume = {0},
year = {2001},
isbn = {0-7695-1378-6},
pages = {57},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990259},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA
SN - 0-7695-1378-6
SP
EP
A1 - M. Gössel,
A1 - V. Ocheretnij,
A1 - S. Chakrabarty,
PY - 2001
VL - 0
JA - Asian Test Symposium
ER -
 
M. Gössel, University of Potsdam
V. Ocheretnij, University of Potsdam
S. Chakrabarty, Kalyani University
In this paper a new diagnosis method or combinational circuits is proposed which is a modification of traditional signature analysis. By this method instead of a technical fault the first erroneous test response in the presence of the considered fault is determined. Additionally to the accumulated signature a one-dimensional output sequence of the MILFSR is monitored during test and diagnosis. Some of the test inputs have to be repeatedly applied or diagnosis.
Citation:
M. Gössel, V. Ocheretnij, S. Chakrabarty, "Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA," ats, pp.57, 10th Asian Test Symposium (ATS'01), 2001
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