A Memory Specific Notation for Fault Modeling

A
ATS
2001
10th Asian Test Symposium (ATS'01)
Abstract - A Memory Specific Notation for Fault Modeling

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Zaid Al-Ars Articles by Ad J. van de Goor Articles by Jens Braun Articles by Detlev Richter

10th Asian Test Symposium (ATS'01)

Kyoto, Japan

November 19-November 21

ISBN: 0-7695-1378-6

	ASCII Text	x
	Zaid Al-Ars, Ad J. van de Goor, Jens Braun, Detlev Richter, "A Memory Specific Notation for Fault Modeling," Asian Test Symposium, pp. 43, 10th Asian Test Symposium (ATS'01), 2001.

	BibTex	x
	@article{ 10.1109/ATS.2001.990257, author = {Zaid Al-Ars and Ad J. van de Goor and Jens Braun and Detlev Richter}, title = {A Memory Specific Notation for Fault Modeling}, journal ={Asian Test Symposium}, volume = {0}, year = {2001}, isbn = {0-7695-1378-6}, pages = {43}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990257}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - A Memory Specific Notation for Fault Modeling SN - 0-7695-1378-6 SP EP A1 - Zaid Al-Ars, A1 - Ad J. van de Goor, A1 - Jens Braun, A1 - Detlev Richter, PY - 2001 KW - functional fault models KW - fault primitives KW - memory testing KW - DRAM KW - memory specific fault analysis VL - 0 JA - Asian Test Symposium ER -

Zaid Al-Ars, Delft University of Technology

Ad J. van de Goor, Delft University of Technology

Jens Braun, Infineon Technologies AG

Detlev Richter, Infineon Technologies AG

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990257

This paper shows the shortcomings of the current, generic notation for fault models and extends it to allow for describing fault models for DRAMs.The advantage is that the extended fault models can easily be translated into operation sequences and tests that detect the described fault. Examples are given to show that the new notation results in optimized, memory specific, tests that have a shorter run time for a given fault coverage.

Index Terms:

functional fault models, fault primitives, memory testing, DRAM, memory specific fault analysis

Citation:

Zaid Al-Ars, Ad J. van de Goor, Jens Braun, Detlev Richter, "A Memory Specific Notation for Fault Modeling," ats, pp.43, 10th Asian Test Symposium (ATS'01), 2001

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.