Tests for Resistive and Capacitive Defects in Address Decoders

A
ATS
2001
10th Asian Test Symposium (ATS'01)
Abstract - Tests for Resistive and Capacitive Defects in Address Decoders

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	Similar Articles Articles by Matthias Klaus Articles by Ad J. van de Goor

10th Asian Test Symposium (ATS'01)

Kyoto, Japan

November 19-November 21

ISBN: 0-7695-1378-6

	ASCII Text	x
	Matthias Klaus, Ad J. van de Goor, "Tests for Resistive and Capacitive Defects in Address Decoders," Asian Test Symposium, pp. 31, 10th Asian Test Symposium (ATS'01), 2001.

	BibTex	x
	@article{ 10.1109/ATS.2001.990255, author = {Matthias Klaus and Ad J. van de Goor}, title = {Tests for Resistive and Capacitive Defects in Address Decoders}, journal ={Asian Test Symposium}, volume = {0}, year = {2001}, isbn = {0-7695-1378-6}, pages = {31}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990255}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Tests for Resistive and Capacitive Defects in Address Decoders SN - 0-7695-1378-6 SP EP A1 - Matthias Klaus, A1 - Ad J. van de Goor, PY - 2001 KW - Defects KW - opens KW - address decoders KW - capacitive coupling KW - dynamic faults KW - test conditions VL - 0 JA - Asian Test Symposium ER -

Matthias Klaus, ProMOS Technologies

Ad J. van de Goor, Delft University of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990255

This paper presents a complete analysis, at the electrical level, of address decoder faults caused by resistive opens, and by capacitive-coupling between address lines. Several authors [3,4,12] have demonstrated the importance of this class of faults. New test conditions, and new march tests are derived to detect the resulting faults; and industrial results, applied to DRAMs, show the effectiveness of the new tests.

Index Terms:

Defects, opens, address decoders, capacitive coupling, dynamic faults, test conditions

Citation:

Matthias Klaus, Ad J. van de Goor, "Tests for Resistive and Capacitive Defects in Address Decoders," ats, pp.31, 10th Asian Test Symposium (ATS'01), 2001

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