Design for Hierarchical Two-Pattern Testability of Data Paths

A
ATS
2001
10th Asian Test Symposium (ATS'01)
Abstract - Design for Hierarchical Two-Pattern Testability of Data Paths

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10th Asian Test Symposium (ATS'01)

Kyoto, Japan

November 19-November 21

ISBN: 0-7695-1378-6

	ASCII Text	x
	Md. Altaf-Ul-Amin, Satoshi Ohtake, Hideo Fujiwara, "Design for Hierarchical Two-Pattern Testability of Data Paths," Asian Test Symposium, pp. 11, 10th Asian Test Symposium (ATS'01), 2001.

	BibTex	x
	@article{ 10.1109/ATS.2001.990251, author = {Md. Altaf-Ul-Amin and Satoshi Ohtake and Hideo Fujiwara}, title = {Design for Hierarchical Two-Pattern Testability of Data Paths}, journal ={Asian Test Symposium}, volume = {0}, year = {2001}, isbn = {0-7695-1378-6}, pages = {11}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990251}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Design for Hierarchical Two-Pattern Testability of Data Paths SN - 0-7695-1378-6 SP EP A1 - Md. Altaf-Ul-Amin, A1 - Satoshi Ohtake, A1 - Hideo Fujiwara, PY - 2001 VL - 0 JA - Asian Test Symposium ER -

Md. Altaf-Ul-Amin, Nara Institute of Science and Technology

Satoshi Ohtake, Nara Institute of Science and Technology

Hideo Fujiwara, Nara Institute of Science and Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990251

This paper introduces the concept of hierarchical testability of data paths for delay faults. A definition of hierarchically two-pattern testable (HTPT) data path is developed. Also, a design for testability (DFT) method is presented to augment a data path to an HTPT one. The DFT method incorporates a graph-based analysis of an HTPT data path and makes use of some graph algorithms. The proposed method can provide the similar advantages of the enhanced scan approach at the cost of much lower hardware overhead.

Citation:

Md. Altaf-Ul-Amin, Satoshi Ohtake, Hideo Fujiwara, "Design for Hierarchical Two-Pattern Testability of Data Paths," ats, pp.11, 10th Asian Test Symposium (ATS'01), 2001

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