The semiconductor industry is capable of building "Tester-limited fabs" and definitely needs a more cost-effective solution for the cost of test problem than the one we have today. The solutions are likely to come from several different sources. While the ATE industry is addressing the cost of test problem by designing new DFT testers, it is the EDA industry that holds the key to providing an embedded test solution that guarantees high-quality low cost manufacturing test. In this presentation we examine various DFT technologies and their ability to provide high quality low cost manufacturing test.