Accumulation-based concurrent fault detection for linear digital state variable systems

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Ninth Asian Test Symposium (ATS'00)

Taipei, Taiwan

December 04-December 06

ISBN: 0-7695-0887-1

	ASCII Text	x
	I. Bayraktaroglu, A. Orailoglu, "Accumulation-based concurrent fault detection for linear digital state variable systems," Asian Test Symposium, pp. 484, Ninth Asian Test Symposium (ATS'00), 2000.

	BibTex	x
	@article{ 10.1109/ATS.2000.893671, author = {I. Bayraktaroglu and A. Orailoglu}, title = {Accumulation-based concurrent fault detection for linear digital state variable systems}, journal ={Asian Test Symposium}, volume = {0}, year = {2000}, issn = {1081-7735}, pages = {484}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893671}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Accumulation-based concurrent fault detection for linear digital state variable systems SN - 1081-7735 SP EP A1 - I. Bayraktaroglu, A1 - A. Orailoglu, PY - 2000 KW - fault diagnosis; digital systems; linear systems; error detection; digital signal processing chips; digital filters; logic testing; concurrent fault detection; linear digital state variable systems; algorithmic fault detection scheme; accumulation-based approach; area overhead; error detection VL - 0 JA - Asian Test Symposium ER -

I. Bayraktaroglu, California Univ., San Diego, La Jolla, CA, USA

A. Orailoglu, California Univ., San Diego, La Jolla, CA, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893671

An algorithmic fault detection scheme for linear digital state variable systems is proposed. The proposed scheme eliminates the necessity of observing the internal states of the system for concurrent fault detection by utilizing an accumulation-based approach. Observation merely of the inputs and the outputs results in significantly reduced area overhead and no performance penalty. Experimental results verify that 100% concurrent fault detection is attainable for linear digital state variable systems.

Index Terms:

fault diagnosis; digital systems; linear systems; error detection; digital signal processing chips; digital filters; logic testing; concurrent fault detection; linear digital state variable systems; algorithmic fault detection scheme; accumulation-based approach; area overhead; error detection

Citation:

I. Bayraktaroglu, A. Orailoglu, "Accumulation-based concurrent fault detection for linear digital state variable systems," ats, pp.484, Ninth Asian Test Symposium (ATS'00), 2000

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