loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Ninth Asian Test Symposium (ATS'00)
On testing safety-sensitive digital systems
Taipei, Taiwan
December 04-December 06
ISBN: 0-7695-0887-1
J. Savir, Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
This paper deals with studying the effects of both online and off-line test during flight critical missions where safety is a major issue. The on-line test, in this context, is a test performed on a digital airborne system during some specified windows in time while it is still performing its intended task. An off-line test is a test that is performed on the digital system once it is taken off-line because of a suspected failure. Both the on-line and the off-line tests are performed during flight. The difference between the two is that the off-line test can be made more effective than the on-line test due to the longer amount of time available for testing. Moreover, the off-line test may be designed to have diagnosis and repair capabilities built-in. Upon successful repair, the faulty processor may be reconfigured back into the system. This capability will undoubtedly increase the mission reliability.
Index Terms:
reliability; aerospace testing; redundancy; fault diagnosis; safety systems; digital systems; safety-sensitive digital systems; off-line test; online test; flight critical missions; digital airborne system; repair capabilities; diagnosis capabilities; mission reliability
Citation:
J. Savir, "On testing safety-sensitive digital systems," ats, pp.478, Ninth Asian Test Symposium (ATS'00), 2000
Usage of this product signifies your acceptance of the Terms of Use.