Ninth Asian Test Symposium (ATS'00) A method for determining whether asynchronous circuits are self-checking Taipei, Taiwan December 04-December 06 ISBN: 0-7695-0887-1
While asynchronous circuits offer potential advantages over synchronous circuits, particularly in the form of low power and low noise properties, it is widely held that they are more difficult to test. The self-checking properties of semi-modular asynchronous circuits with respect to certain stuck-at faults have been known for many years, but the restrictions have been such that it has not been feasible to make use of this property to enhance testability. In this paper we demonstrate the feasibility of a technique to determine whether a proposed asynchronous circuit implementation is totally self-checking with respect to all output stuck-at-faults. This test can he incorporated into the design process to select a self-checking implementation when several alternatives are available.
Index Terms:
asynchronous circuits; low-power electronics; integrated circuit testing; integrated circuit noise; design for testability; fault diagnosis; logic testing; TSC; low power; low noise properties; semi-modular asynchronous circuit; testability; totally self-checking; output stuck-at-faults
Citation:
M.J. Liebelt, Cheng-Chew Lim, "A method for determining whether asynchronous circuits are self-checking," ats, pp.472, Ninth Asian Test Symposium (ATS'00), 2000 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||