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Ninth Asian Test Symposium (ATS'00)
Design and testing of fast and cost effective serial seeding TPGs based on one-dimensional linear hybrid cellular automata
Taipei, Taiwan
December 04-December 06
ISBN: 0-7695-0887-1
A. Hlawiczka, Inst. of Electron., Silesian Univ. of Technol., Gliwice, Poland
M. Kopec, Inst. of Electron., Silesian Univ. of Technol., Gliwice, Poland
The paper proposes the approach of designing CA registers that work as quick pattern generators. A new effective method of setting the initial state of such registers is presented. It is based on switching a n-cell CA register into a concatenation of p CdSR registers (Cellular Automata quasi Shift Register) each containing r cells and connected with characteristic polynomial x'. The resultant characteristic polynomial of such concatenation is p(x)=x/sup n/. Such concatenation of p registers CASR is referred as PCASR. The paper proves the possibility of setting a PCASR to any initial state by n-bit input sequence without the need of switching flip-flops into the D flip-flop mode. Moreover, it has been proven that any input sequence would be repeated at the output of a n-cell PCASR after n-clock cycle delay. Finally an effective procedure of testing PCASR is proposed.
Index Terms:
cellular automata; shift registers; automatic test pattern generation; logic testing; flip-flops; application specific integrated circuits; integrated circuit testing; integrated circuit economics; polynomials; logic CAD; serial seeding; TPG; linear hybrid cellular automata; pattern generators; n-cell CA register; p CdSR registers; cellular automata quasi shift register; polynomial; PCASR; n-bit input sequence; flip-flops; cost
Citation:
A. Hlawiczka, M. Kopec, "Design and testing of fast and cost effective serial seeding TPGs based on one-dimensional linear hybrid cellular automata," ats, pp.380, Ninth Asian Test Symposium (ATS'00), 2000
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