TI-BIST: a temperature independent analog BIST for switched-capacitor filters

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	Similar Articles Articles by L. Carro Articles by E. Cota Articles by M. Lubaszewski Articles by Y. Bertrand Articles by F. Azais Articles by M. Renovell

Ninth Asian Test Symposium (ATS'00)

Taipei, Taiwan

December 04-December 06

ISBN: 0-7695-0887-1

	ASCII Text	x
	L. Carro, E. Cota, M. Lubaszewski, Y. Bertrand, F. Azais, M. Renovell, "TI-BIST: a temperature independent analog BIST for switched-capacitor filters," Asian Test Symposium, pp. 78, Ninth Asian Test Symposium (ATS'00), 2000.

	BibTex	x
	@article{ 10.1109/ATS.2000.893606, author = {L. Carro and E. Cota and M. Lubaszewski and Y. Bertrand and F. Azais and M. Renovell}, title = {TI-BIST: a temperature independent analog BIST for switched-capacitor filters}, journal ={Asian Test Symposium}, volume = {0}, year = {2000}, issn = {1081-7735}, pages = {78}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893606}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - TI-BIST: a temperature independent analog BIST for switched-capacitor filters SN - 1081-7735 SP EP A1 - L. Carro, A1 - E. Cota, A1 - M. Lubaszewski, A1 - Y. Bertrand, A1 - F. Azais, A1 - M. Renovell, PY - 2000 KW - built-in self test; analogue circuits; switched capacitor filters; temperature independent analog BIST; switched-capacitor filters; BIST; analog BIST; simulation VL - 0 JA - Asian Test Symposium ER -

L. Carro, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil

E. Cota, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil

M. Lubaszewski, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil

Y. Bertrand, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil

F. Azais, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil

M. Renovell, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893606

This paper describes a method to obtain a temperature independent analog BIST. The test procedure is based on the reuse of existing analog circuits, configured either as stimuli generators or as signature analyzers. The paper explains the general problem of temperature deviation present in analog BIST, and shows an approach to overcome this limitation, validated by simulation results.

Index Terms:

built-in self test; analogue circuits; switched capacitor filters; temperature independent analog BIST; switched-capacitor filters; BIST; analog BIST; simulation

Citation:

L. Carro, E. Cota, M. Lubaszewski, Y. Bertrand, F. Azais, M. Renovell, "TI-BIST: a temperature independent analog BIST for switched-capacitor filters," ats, pp.78, Ninth Asian Test Symposium (ATS'00), 2000

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