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Ninth Asian Test Symposium (ATS'00)
Testing mixed-signal cores: practical oscillation-based test in an analog macrocell
Taipei, Taiwan
December 04-December 06
ISBN: 0-7695-0887-1
ASCII Text
x 
 
G. Huertas, D. Vazquez, E. Peralias, A. Rueda, J.L. Huertas, "Testing mixed-signal cores: practical oscillation-based test in an analog macrocell," Asian Test Symposium, pp. 31, Ninth Asian Test Symposium (ATS'00), 2000.
 
 
BibTex
x
 
@article{ 10.1109/ATS.2000.893599,
author = {G. Huertas and D. Vazquez and E. Peralias and A. Rueda and J.L. Huertas},
title = {Testing mixed-signal cores: practical oscillation-based test in an analog macrocell},
journal ={Asian Test Symposium},
volume = {0},
year = {2000},
issn = {1081-7735},
pages = {31},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893599},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Testing mixed-signal cores: practical oscillation-based test in an analog macrocell
SN - 1081-7735
SP
EP
A1 - G. Huertas,
A1 - D. Vazquez,
A1 - E. Peralias,
A1 - A. Rueda,
A1 - J.L. Huertas,
PY - 2000
KW - mixed analogue-digital integrated circuits; integrated circuit testing; oscillation-based test; analog macrocell; mixed signal integrated circuit; OBT; mixed-signal macrocell
VL - 0
JA - Asian Test Symposium
ER -
 
G. Huertas, Inst. de Microelectron., Seville Univ., Spain
D. Vazquez, Inst. de Microelectron., Seville Univ., Spain
E. Peralias, Inst. de Microelectron., Seville Univ., Spain
A. Rueda, Inst. de Microelectron., Seville Univ., Spain
J.L. Huertas, Inst. de Microelectron., Seville Univ., Spain
This paper presents an operational method for converting into digital the analog waveforms resulting when oscillation-based test (OBT) is applied to a mixed signal integrated circuit. Although our aim is OBT this technique can be used in structural testing in general. A complex mixed-signal macrocell is used as an example to demonstrate the pros and cons of the technique.
Index Terms:
mixed analogue-digital integrated circuits; integrated circuit testing; oscillation-based test; analog macrocell; mixed signal integrated circuit; OBT; mixed-signal macrocell
Citation:
G. Huertas, D. Vazquez, E. Peralias, A. Rueda, J.L. Huertas, "Testing mixed-signal cores: practical oscillation-based test in an analog macrocell," ats, pp.31, Ninth Asian Test Symposium (ATS'00), 2000
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