Analog Metrology and Stimulus Selection in a Noisy Environment

A
ATS
1999
Eighth Asian Test Symposium (ATS'99)
Abstract - Analog Metrology and Stimulus Selection in a Noisy Environment

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Chauchin Su Articles by Yue-Tsang Chen Articles by Chung-Len Lee

Eighth Asian Test Symposium (ATS'99)

Shanghai, China

November 16-November 18

ISBN: 0-7695-0315-2

	ASCII Text	x
	Chauchin Su, Yue-Tsang Chen, Chung-Len Lee, "Analog Metrology and Stimulus Selection in a Noisy Environment," Asian Test Symposium, pp. 233, Eighth Asian Test Symposium (ATS'99), 1999.

	BibTex	x
	@article{ 10.1109/ATS.1999.810756, author = {Chauchin Su and Yue-Tsang Chen and Chung-Len Lee}, title = {Analog Metrology and Stimulus Selection in a Noisy Environment}, journal ={Asian Test Symposium}, volume = {0}, year = {1999}, issn = {1081-7735}, pages = {233}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810756}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Analog Metrology and Stimulus Selection in a Noisy Environment SN - 1081-7735 SP EP A1 - Chauchin Su, A1 - Yue-Tsang Chen, A1 - Chung-Len Lee, PY - 1999 KW - Mixed Signal and Analog Test VL - 0 JA - Asian Test Symposium ER -

Chauchin Su, National Central University

Yue-Tsang Chen, National Central University

Chung-Len Lee, National Chiao Tung University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810756

In this paper, an analog metrology and test stimulus selection guidelines are proposed based on the frequency domain analysis of the stimulus and the CUT. To show the feasibility, a 4th order leapfrog filter and a DSP deconvolution operation are used as the test vehicle. The experimental results on the real measured data show that the increase in observation periods can effectively compensate the increase in the environment noise.

Index Terms:

Mixed Signal and Analog Test

Citation:

Chauchin Su, Yue-Tsang Chen, Chung-Len Lee, "Analog Metrology and Stimulus Selection in a Noisy Environment," ats, pp.233, Eighth Asian Test Symposium (ATS'99), 1999

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.