Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation

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	Similar Articles Articles by Mario Konijnenburg Articles by Hans Van der Linden Articles by Ad van de Goor

Eighth Asian Test Symposium (ATS'99)

Shanghai, China

November 16-November 18

ISBN: 0-7695-0315-2

	ASCII Text	x
	Mario Konijnenburg, Hans Van der Linden, Ad van de Goor, "Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation," Asian Test Symposium, pp. 185, Eighth Asian Test Symposium (ATS'99), 1999.

	BibTex	x
	@article{ 10.1109/ATS.1999.810749, author = {Mario Konijnenburg and Hans Van der Linden and Ad van de Goor}, title = {Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation}, journal ={Asian Test Symposium}, volume = {0}, year = {1999}, issn = {1081-7735}, pages = {185}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810749}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation SN - 1081-7735 SP EP A1 - Mario Konijnenburg, A1 - Hans Van der Linden, A1 - Ad van de Goor, PY - 1999 KW - ATPG KW - sequential circuit TPG KW - cost estimates KW - back-jumping KW - conflict-directed backtrack KW - three-state (tri-state) circuit TPG VL - 0 JA - Asian Test Symposium ER -

Mario Konijnenburg, Philips Research Laboratories

Hans Van der Linden, Delft University of Technology

Ad van de Goor, Delft University of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810749

The search for tests for sequential circuits (STPG) by deterministic test pattern generation is a process of alternately performing mandatory assignments and heuristic decisions on signal lines. We have observed problems in the decision-making process due to shortcomings in the SCOAP controllability/observability metrics and the backtrack process during STPG.In this paper we propose new techniques to improve the controllability/observability metrics, and two forms of conflict-directed backtracking (back-jumping) to improve the backtrack process.Experimental results demonstrate that the proposed techniques are very promising and result in a significant improvement in fault efficiencies and CPU usage for the ISCAS'89 and industrial circuits.

Index Terms:

ATPG, sequential circuit TPG, cost estimates, back-jumping, conflict-directed backtrack, three-state (tri-state) circuit TPG

Citation:

Mario Konijnenburg, Hans Van der Linden, Ad van de Goor, "Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation," ats, pp.185, Eighth Asian Test Symposium (ATS'99), 1999

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