A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits

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Eighth Asian Test Symposium (ATS'99)

Shanghai, China

November 16-November 18

ISBN: 0-7695-0315-2

	ASCII Text	x
	Zhide Zeng, Jihua Chen, Pengxia Liu, "A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits," Asian Test Symposium, pp. 133, Eighth Asian Test Symposium (ATS'99), 1999.

	BibTex	x
	@article{ 10.1109/ATS.1999.810741, author = {Zhide Zeng and Jihua Chen and Pengxia Liu}, title = {A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits}, journal ={Asian Test Symposium}, volume = {0}, year = {1999}, issn = {1081-7735}, pages = {133}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810741}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits SN - 1081-7735 SP EP A1 - Zhide Zeng, A1 - Jihua Chen, A1 - Pengxia Liu, PY - 1999 KW - Parallel Test Generation KW - Fault Parallelism KW - Fault Partitioning KW - Output Fan-in Cones KW - Input Fan-out Cones KW - Speed-up Ratio VL - 0 JA - Asian Test Symposium ER -

Zhide Zeng, National University of Defense Technology

Jihua Chen, National University of Defense Technology

Pengxia Liu, National University of Defense Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810741

Firstly, we propose a method in theory about how to increase the speed-up ratio in parallel test generation based on fault partitioning. Based on the method a new fault partitioning approach - Backward Fault Partitioning based on Output fan-in Cones (BFPOC) - is presented, which combines the relevant fault identification and shortest path sensitization. Then, BFPOC is compared via experiments with the approach of Toward Fault Partitioning based on Input fan-out Cones (TFPIC) proposed by Banejee and the widely used method - Equal Distance Partitioning of Fault Sequence (EDPFS) respectively. The results show that in large-scale parallel processing environment, BOPOC can obtain higher speed-up ratio than the other two approaches.

Index Terms:

Parallel Test Generation, Fault Parallelism, Fault Partitioning, Output Fan-in Cones, Input Fan-out Cones, Speed-up Ratio

Citation:

Zhide Zeng, Jihua Chen, Pengxia Liu, "A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits," ats, pp.133, Eighth Asian Test Symposium (ATS'99), 1999

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