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Eighth Asian Test Symposium (ATS'99)
Identification of Feedback Bridging Faults with Oscillation
Shanghai, China
November 16-November 18
ISBN: 0-7695-0315-2
Masaki Hashizume, University of Tokushima
Hiroyuki Yotsuyanagi, University of Tokushima
Takeomi Tamesada, University of Tokushima
When a feedback bridging fault occurs in a combinational circuit and it is activated, logical oscillation may be generated at the bridging signal lines. In this paper, the necessary conditions are presented for feedback bridging faults to generate logical oscillation. Also, a method is proposed to identify such faults in feedback bridging ones. It is based on piecewise-linearlized models obtained from input/output characteristics of logic gates and does not require circuit simulation of large size of circuits to identify them. In the experiments for evaluating the method, all of the feedback bridging faults to generate logical oscillation are identified by using the method.
Index Terms:
feedback bridging fault, oscillation, CMOS, logic circuit
Citation:
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, "Identification of Feedback Bridging Faults with Oscillation," ats, pp.25, Eighth Asian Test Symposium (ATS'99), 1999
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