Y. Sameshima, T. Fukazawa, "A DFT Methodology for High-Speed MCM Based on Boundary-Scan Techniques," Asian Test Symposium, pp. 521, Seventh Asian Test Symposium (ATS'98), 1998.

@article{ 10.1109/ATS.1998.1191704,
author = {Y. Sameshima and T. Fukazawa},
title = {A DFT Methodology for High-Speed MCM Based on Boundary-Scan Techniques},
journal ={Asian Test Symposium},
volume = {0},
year = {1998},
issn = {1081-7735},
pages = {521},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.1191704},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Asian Test Symposium
TI - A DFT Methodology for High-Speed MCM Based on Boundary-Scan Techniques
SN - 1081-7735
SP
EP
A1 - Y. Sameshima,
A1 - T. Fukazawa,
PY - 1998
VL - 0
JA - Asian Test Symposium
ER -