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Seventh Asian Test Symposium (ATS'98)
An Efficient Random-like Testing
Singapore
December 02-December 04
ISBN: 0-8186-8277-9
ASCII Text
x 
 
Shiyi Xu, Jianhua Gao, "An Efficient Random-like Testing," Asian Test Symposium, pp. 504, Seventh Asian Test Symposium (ATS'98), 1998.
 
 
BibTex
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@article{ 10.1109/ATS.1998.741664,
author = {Shiyi Xu and Jianhua Gao},
title = {An Efficient Random-like Testing},
journal ={Asian Test Symposium},
volume = {0},
year = {1998},
issn = {1081-7735},
pages = {504},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741664},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - An Efficient Random-like Testing
SN - 1081-7735
SP
EP
A1 - Shiyi Xu,
A1 - Jianhua Gao,
PY - 1998
VL - 0
JA - Asian Test Symposium
ER -
 
Shiyi Xu, Shanghai University
Jianhua Gao, Shanghai University
This paper introduces the concepts of random-like testing. In a random-like testing sequence, the total distance among all of the test patterns is chosen maximal so that the sets of faults detected by one test pattern are as different as possible from that of faults detected by the tests previously applied . Procedure of constructing a random-like testing sequence (RLTS) is described in detail. Theorems to justify the effectiveness and helpfulness of the procedure presented are developed. Experimental results on Benchmark circuits as well as on other circuit are also given to evaluate the performances of our new approach.
Citation:
Shiyi Xu, Jianhua Gao, "An Efficient Random-like Testing," ats, pp.504, Seventh Asian Test Symposium (ATS'98), 1998
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