loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Seventh Asian Test Symposium (ATS'98)
DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity
Singapore
December 02-December 04
ISBN: 0-8186-8277-9
Recently a method was proposed for using Large Change Sensitivity for d.c. nonlinear circuit fault simulation. This allowed the advantages of Large Change Sensitivity, namely computational efficiency and exactness of solution, to become available for nonlinear circuit Simulation-Before-Test fault diagnosis. This paper improves on that work by further reducing the computational effort in calculating the Large Change Sensitivity of nonlinear circuit faults and generalising the algorithm to handle circuits of multiple nonlinear components. Faults are restricted to single catastrophic or parametric linear component faults.
Citation:
Mike W.T. Wong, Matthew Worsman., "DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity," ats, pp.366, Seventh Asian Test Symposium (ATS'98), 1998
Usage of this product signifies your acceptance of the Terms of Use.