Seventh Asian Test Symposium (ATS'98) DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity Singapore December 02-December 04 ISBN: 0-8186-8277-9
Recently a method was proposed for using Large Change Sensitivity for d.c. nonlinear circuit fault simulation. This allowed the advantages of Large Change Sensitivity, namely computational efficiency and exactness of solution, to become available for nonlinear circuit Simulation-Before-Test fault diagnosis. This paper improves on that work by further reducing the computational effort in calculating the Large Change Sensitivity of nonlinear circuit faults and generalising the algorithm to handle circuits of multiple nonlinear components. Faults are restricted to single catastrophic or parametric linear component faults.
Citation:
Mike W.T. Wong, Matthew Worsman., "DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity," ats, pp.366, Seventh Asian Test Symposium (ATS'98), 1998 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||