Vi.V. Saposhnikov, V.V. Saposhnikov, A. Dmitriev, M. Goessel, "Self-Dual Duplication for Error Detection," Asian Test Symposium, pp. 296, Seventh Asian Test Symposium (ATS'98), 1998.

@article{ 10.1109/ATS.1998.741628,
author = {Vi.V. Saposhnikov and V.V. Saposhnikov and A. Dmitriev and M. Goessel},
title = {Self-Dual Duplication for Error Detection},
journal ={Asian Test Symposium},
volume = {0},
year = {1998},
issn = {1081-7735},
pages = {296},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741628},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Asian Test Symposium
TI - Self-Dual Duplication for Error Detection
SN - 1081-7735
SP
EP
A1 - Vi.V. Saposhnikov,
A1 - V.V. Saposhnikov,
A1 - A. Dmitriev,
A1 - M. Goessel,
PY - 1998
VL - 0
JA - Asian Test Symposium
ER -