Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths

A
ATS
1998
Seventh Asian Test Symposium (ATS'98)
Abstract - Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths

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Seventh Asian Test Symposium (ATS'98)

Singapore

December 02-December 04

ISBN: 0-8186-8277-9

	ASCII Text	x
	Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu, "Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths," Asian Test Symposium, pp. 237, Seventh Asian Test Symposium (ATS'98), 1998.

	BibTex	x
	@article{ 10.1109/ATS.1998.741619, author = {Nobuhiro Yanagida and Hiroshi Takahashi and Yuzo Takamatsu}, title = {Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {237}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741619}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths SN - 1081-7735 SP EP A1 - Nobuhiro Yanagida, A1 - Hiroshi Takahashi, A1 - Yuzo Takamatsu, PY - 1998 VL - 0 JA - Asian Test Symposium ER -

Nobuhiro Yanagida, Kaminomoto Corporation

Hiroshi Takahashi, Ehime University

Yuzo Takamatsu, Ehime University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741619

In this paper, we propose an Electron Beam tester (EB-tester) aided fault diagnosis for combinational and sequential circuits based on sensitized paths. For combinational circuits, we enhance the previous set of sensitizing input pairs\cite{DandT} and present EB-tester aided fault diagnosis. For sequential circuits, we introduce a measure for selecting internal lines to be probed and present EB-tester aided fault diagnosis. Experimental results of ISCAS'85 and ISCAS'89 benchmark circuits show the efficiency of the presented methods.

Citation:

Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu, "Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths," ats, pp.237, Seventh Asian Test Symposium (ATS'98), 1998

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