J.T. Van der Linden, M.H. Konijnenburg, A.J. van de Goor, "Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection," Asian Test Symposium, pp. 212, Seventh Asian Test Symposium (ATS'98), 1998.

@article{ 10.1109/ATS.1998.741616,
author = {J.T. Van der Linden and M.H. Konijnenburg and A.J. van de Goor},
title = {Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection},
journal ={Asian Test Symposium},
volume = {0},
year = {1998},
issn = {1081-7735},
pages = {212},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741616},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Asian Test Symposium
TI - Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection
SN - 1081-7735
SP
EP
A1 - J.T. Van der Linden,
A1 - M.H. Konijnenburg,
A1 - A.J. van de Goor,
PY - 1998
VL - 0
JA - Asian Test Symposium
ER -