X. Wen, T. Honzawa, H. Tamamoto, K.K. Suluja, K. Kinoshita, "Design for Diagnosability of CMOS Circuits," Asian Test Symposium, pp. 144, Seventh Asian Test Symposium (ATS'98), 1998.

@article{ 10.1109/ATS.1998.741605,
author = {X. Wen and T. Honzawa and H. Tamamoto and K.K. Suluja and K. Kinoshita},
title = {Design for Diagnosability of CMOS Circuits},
journal ={Asian Test Symposium},
volume = {0},
year = {1998},
issn = {1081-7735},
pages = {144},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741605},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Asian Test Symposium
TI - Design for Diagnosability of CMOS Circuits
SN - 1081-7735
SP
EP
A1 - X. Wen,
A1 - T. Honzawa,
A1 - H. Tamamoto,
A1 - K.K. Suluja,
A1 - K. Kinoshita,
PY - 1998
VL - 0
JA - Asian Test Symposium
ER -