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Seventh Asian Test Symposium (ATS'98)
The New Frontier for Testing: Nano Meter Technologies
Singapore
December 02-December 04
ISBN: 0-8186-8277-9
ASCII Text
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T. Williams, "The New Frontier for Testing: Nano Meter Technologies," Asian Test Symposium, pp. 2, Seventh Asian Test Symposium (ATS'98), 1998.
 
 
BibTex
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@article{ 10.1109/ATS.1998.741567,
author = {T. Williams},
title = {The New Frontier for Testing: Nano Meter Technologies},
journal ={Asian Test Symposium},
volume = {0},
year = {1998},
issn = {1081-7735},
pages = {2},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741567},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - The New Frontier for Testing: Nano Meter Technologies
SN - 1081-7735
SP
EP
A1 - T. Williams,
PY - 1998
VL - 0
JA - Asian Test Symposium
ER -
 
Citation:
T. Williams, "The New Frontier for Testing: Nano Meter Technologies," ats, pp.2, Seventh Asian Test Symposium (ATS'98), 1998
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