Sixth Asian Test Symposium (ATS'97) Built-in current sensor designs based on the bulk-driven technique Akita, JAPAN November 17-November 18 ISBN: 0-8186-8209-4
Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes end respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead.
Index Terms:
electric current measurement; built-in current sensor; bulk-driven current mirror; biasing schemes; simplicity; accuracy; flexibility; low power dissipation; power supply voltage drop; circuit speed degradation; external power supply; area overhead; I/sub DDQ/ testing; 0.3 V; 0.3 ns
Citation:
Tsung-Chu Huang, Min-Cheng Huang, Kuen-Jong Lee, "Built-in current sensor designs based on the bulk-driven technique," ats, pp.384, Sixth Asian Test Symposium (ATS'97), 1997 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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