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Sixth Asian Test Symposium (ATS'97)
Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates
Akita, JAPAN
November 17-November 18
ISBN: 0-8186-8209-4
ASCII Text
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Masaki Hashizume, Toshimasa Kuchii, Takeomi Tamesada, "Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates," Asian Test Symposium, pp. 372, Sixth Asian Test Symposium (ATS'97), 1997.
 
 
BibTex
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@article{ 10.1109/ATS.1997.643985,
author = {Masaki Hashizume and Toshimasa Kuchii and Takeomi Tamesada},
title = {Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates},
journal ={Asian Test Symposium},
volume = {0},
year = {1997},
issn = {1081-7735},
pages = {372},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643985},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates
SN - 1081-7735
SP
EP
A1 - Masaki Hashizume,
A1 - Toshimasa Kuchii,
A1 - Takeomi Tamesada,
PY - 1997
VL - 0
JA - Asian Test Symposium
ER -
 
Masaki Hashizume, The Univ. of Tokushima
Toshimasa Kuchii, The Univ. of Tokushima
Takeomi Tamesada, The Univ. of Tokushima
A practical supply current test method is proposed and the experimental evaluation results are presented. In the method, the unit-to-unit variation of electrical characteristics in each logic gate is modeled as a Gaussian distribution and faults are detected with a statistical hypothesis technique.
Citation:
Masaki Hashizume, Toshimasa Kuchii, Takeomi Tamesada, "Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates," ats, pp.372, Sixth Asian Test Symposium (ATS'97), 1997
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