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Sixth Asian Test Symposium (ATS'97)
On the Complexity of Universal Fault Diagnosis for Look-up Table FPGAs
Akita, JAPAN
November 17-November 18
ISBN: 0-8186-8209-4
Tomoo Inoue, Nara Institute of Science and Technology
Satoshi Miyazaki, Nara Institute of Science and Technology
Hideo Fujiwara, Nara Institute of Science and Technology
In this paper, we introduce universal fault diagnosis such that when applied to an unprogrammed FPGA, it locates a fault in any faulty programmed FPGA corresponding to the unprogrammed FPGA. If a faulty part in an FPGA can be identified prior to programming it, we can implement a required logic function on the fault-free part by isolating the faulty part. Then, we propose a universal fault diagnosis procedure that locates a faulty CLB in a look-up table FPGA. The complexity of the universal diagnosis procedure for FPGAs with block-sliced loading is independent of its array size, i.e., C-diagnosable.
Index Terms:
Look-up table FPGAs, universal fault diagnosis, diagnosis complexity, C-diagnosable
Citation:
Tomoo Inoue, Satoshi Miyazaki, Hideo Fujiwara, "On the Complexity of Universal Fault Diagnosis for Look-up Table FPGAs," ats, pp.276, Sixth Asian Test Symposium (ATS'97), 1997
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