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Sixth Asian Test Symposium (ATS'97)
Analog signal metrology for mixed signal ICs
Akita, JAPAN
November 17-November 18
ISBN: 0-8186-8209-4
ASCII Text
x 
 
Chauchin Su, Yi-Ren Cheng, Yue-Tsang Chen, Shing Tenchen, "Analog signal metrology for mixed signal ICs," Asian Test Symposium, pp. 194, Sixth Asian Test Symposium (ATS'97), 1997.
 
 
BibTex
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@article{ 10.1109/ATS.1997.643958,
author = {Chauchin Su and Yi-Ren Cheng and Yue-Tsang Chen and Shing Tenchen},
title = {Analog signal metrology for mixed signal ICs},
journal ={Asian Test Symposium},
volume = {0},
year = {1997},
issn = {1081-7735},
pages = {194},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643958},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Analog signal metrology for mixed signal ICs
SN - 1081-7735
SP
EP
A1 - Chauchin Su,
A1 - Yi-Ren Cheng,
A1 - Yue-Tsang Chen,
A1 - Shing Tenchen,
PY - 1997
KW - mixed analogue-digital integrated circuits; Analog signal metrology; mixed signal IC; Signal reconstruction; multiple period low-rate sampled waveform; high-rate sampled waveform; DSP based testing; on-chip ADC; 20 MHz
VL - 0
JA - Asian Test Symposium
ER -
 
Chauchin Su, Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Yi-Ren Cheng, Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Yue-Tsang Chen, Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Shing Tenchen, Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Signal reconstruction reconstructs a multiple period low-rate sampled waveform into a one-period high-rate sampled waveform. With which, we are able to provide sufficient samples of analog signals for DSP based testing using on-chip ADCs. Test results show that a 128-sample-per-period waveform can be reconstructed from a 2.4 samples per period waveform sampled by a 20 MHz 8-bit ADC.
Index Terms:
mixed analogue-digital integrated circuits; Analog signal metrology; mixed signal IC; Signal reconstruction; multiple period low-rate sampled waveform; high-rate sampled waveform; DSP based testing; on-chip ADC; 20 MHz
Citation:
Chauchin Su, Yi-Ren Cheng, Yue-Tsang Chen, Shing Tenchen, "Analog signal metrology for mixed signal ICs," ats, pp.194, Sixth Asian Test Symposium (ATS'97), 1997
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