Testability Features of R10000 Microprocessor

A
ATS
1997
Sixth Asian Test Symposium (ATS'97)
Abstract - Testability Features of R10000 Microprocessor

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Sixth Asian Test Symposium (ATS'97)

Akita, JAPAN

November 17-November 18

ISBN: 0-8186-8209-4

	ASCII Text	x
	Junji Mori, Ben Mathew, Dave Burns, Yeuk-Hai Mok, "Testability Features of R10000 Microprocessor," Asian Test Symposium, pp. 108, Sixth Asian Test Symposium (ATS'97), 1997.

	BibTex	x
	@article{ 10.1109/ATS.1997.643930, author = {Junji Mori and Ben Mathew and Dave Burns and Yeuk-Hai Mok}, title = {Testability Features of R10000 Microprocessor}, journal ={Asian Test Symposium}, volume = {0}, year = {1997}, issn = {1081-7735}, pages = {108}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643930}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Testability Features of R10000 Microprocessor SN - 1081-7735 SP EP A1 - Junji Mori, A1 - Ben Mathew, A1 - Dave Burns, A1 - Yeuk-Hai Mok, PY - 1997 KW - Lfsr KW - Fault Simulation KW - Observability Register KW - Memory Test KW - Clock Stretch VL - 0 JA - Asian Test Symposium ER -

Junji Mori, Toshiba Corp.

Ben Mathew, Silicon Graphics Inc.

Dave Burns, Silicon Graphics Inc.

Yeuk-Hai Mok, Silicon Graphics Inc.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643930

This paper describes the testability design features of the R10000 microprocessor. It has specific testability features for debug and manufacturing purposes. Observability registers are implemented to enhance high fault coverage and they partition the chip into three parts to run a fault simulation much faster. Plus, a clock control mechanism for AC path analysis and a minimal impact embedded memory test feature are implemented.

Index Terms:

Lfsr, Fault Simulation, Observability Register, Memory Test, Clock Stretch

Citation:

Junji Mori, Ben Mathew, Dave Burns, Yeuk-Hai Mok, "Testability Features of R10000 Microprocessor," ats, pp.108, Sixth Asian Test Symposium (ATS'97), 1997

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