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Sixth Asian Test Symposium (ATS'97)
Code-Disjoint Circuits for Parity Circuits
Akita, JAPAN
November 17-November 18
ISBN: 0-8186-8209-4
ASCII Text
x 
 
Hendrik Hartje, Michael Goessel, Egor S. Sogomonyan, "Code-Disjoint Circuits for Parity Circuits," Asian Test Symposium, pp. 100, Sixth Asian Test Symposium (ATS'97), 1997.
 
 
BibTex
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@article{ 10.1109/ATS.1997.643929,
author = {Hendrik Hartje and Michael Goessel and Egor S. Sogomonyan},
title = {Code-Disjoint Circuits for Parity Circuits},
journal ={Asian Test Symposium},
volume = {0},
year = {1997},
issn = {1081-7735},
pages = {100},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643929},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Code-Disjoint Circuits for Parity Circuits
SN - 1081-7735
SP
EP
A1 - Hendrik Hartje,
A1 - Michael Goessel,
A1 - Egor S. Sogomonyan,
PY - 1997
VL - 0
JA - Asian Test Symposium
ER -
 
Hendrik Hartje, University of Potsdam
Michael Goessel, University of Potsdam
Egor S. Sogomonyan, Russian Academy of Sciences
In this paper it is shown how a circuit, given as a net-list of gates, can be transformed into two different types of code-disjoint circuits. A new method for a joint design of the functional circuit, the output parity and the input parity is proposed. Carefully selected internal nodes of the functional circuit are utilized to reduce the necessary area overhead for the design of input and output parities.
Citation:
Hendrik Hartje, Michael Goessel, Egor S. Sogomonyan, "Code-Disjoint Circuits for Parity Circuits," ats, pp.100, Sixth Asian Test Symposium (ATS'97), 1997
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