A concurrent fault-detection scheme for FFT processors

A
ATS
1997
Sixth Asian Test Symposium (ATS'97)
Abstract - A concurrent fault-detection scheme for FFT processors

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Sixth Asian Test Symposium (ATS'97)

Akita, JAPAN

November 17-November 18

ISBN: 0-8186-8209-4

	ASCII Text	x
	M. Tsunoyama, M. Uenoyama, T. Kabasawa, "A concurrent fault-detection scheme for FFT processors," Asian Test Symposium, pp. 94, Sixth Asian Test Symposium (ATS'97), 1997.

	BibTex	x
	@article{ 10.1109/ATS.1997.643928, author = {M. Tsunoyama and M. Uenoyama and T. Kabasawa}, title = {A concurrent fault-detection scheme for FFT processors}, journal ={Asian Test Symposium}, volume = {0}, year = {1997}, issn = {1081-7735}, pages = {94}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643928}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - A concurrent fault-detection scheme for FFT processors SN - 1081-7735 SP EP A1 - M. Tsunoyama, A1 - M. Uenoyama, A1 - T. Kabasawa, PY - 1997 KW - fast Fourier transforms; concurrent fault-detection; FFT processors; FFT algorithm; reliable real-time systems; fast Fourier transform VL - 0 JA - Asian Test Symposium ER -

M. Tsunoyama, Niigata Inst. of Technol., Japan

M. Uenoyama, Niigata Inst. of Technol., Japan

T. Kabasawa, Niigata Inst. of Technol., Japan

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643928

This paper proposes a concurrent fault-detection scheme for FFT processors. In the scheme, fault detection is made by comparing the pair of outputs from butterfly units based on the FFT algorithm. The hardware overhead for the scheme is O(N) where N is the number of input data. This scheme requires no extra computations for locating a pair of faulty butterfly units, therefore, the scheme can be used for highly reliable real-time systems.

Index Terms:

fast Fourier transforms; concurrent fault-detection; FFT processors; FFT algorithm; reliable real-time systems; fast Fourier transform

Citation:

M. Tsunoyama, M. Uenoyama, T. Kabasawa, "A concurrent fault-detection scheme for FFT processors," ats, pp.94, Sixth Asian Test Symposium (ATS'97), 1997

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