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Sixth Asian Test Symposium (ATS'97)
Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits
Akita, JAPAN
November 17-November 18
ISBN: 0-8186-8209-4
ASCII Text
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Joseph C.W. Pang, Mike W.T. Wong, Y.S. Lee, "Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits," Asian Test Symposium, pp. 82, Sixth Asian Test Symposium (ATS'97), 1997.
 
 
BibTex
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@article{ 10.1109/ATS.1997.643925,
author = {Joseph C.W. Pang and Mike W.T. Wong and Y.S. Lee},
title = {Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits},
journal ={Asian Test Symposium},
volume = {0},
year = {1997},
issn = {1081-7735},
pages = {82},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643925},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits
SN - 1081-7735
SP
EP
A1 - Joseph C.W. Pang,
A1 - Mike W.T. Wong,
A1 - Y.S. Lee,
PY - 1997
KW - Built-in intermediate voltage sensor
KW - totally self-checking circuit
KW - bridging fault.
VL - 0
JA - Asian Test Symposium
ER -
 
This paper presents a new approach to implement a strongly code-disjoint CMOS built-in intermediate voltage sensor(BIVS). The function of the BIVS is used to detect any intermediate voltage caused by bridging and transistor stuck-on faults in the circuit. Detailed analyses of the proposed circuit have shown that the overall design not only can detect fault in the circuit under test, but also can detect or tolerate the fault in itself. An application example employing the BIVS as the output detection element to enhance the effectiveness of the totally self-checking circuit is given.
Index Terms:
Built-in intermediate voltage sensor, totally self-checking circuit, bridging fault.
Citation:
Joseph C.W. Pang, Mike W.T. Wong, Y.S. Lee, "Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits," ats, pp.82, Sixth Asian Test Symposium (ATS'97), 1997
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